Luque Rodriguez, A.A.Luque RodriguezCano de Andrade, GloriaGloriaCano de AndradeAoulaiche, MarcMarcAoulaicheMendes Almeida, LucianoLucianoMendes AlmeidaClaeys, CorCorClaeysJimenez Tejada, J.A.J.A.Jimenez TejadaJurczak, GosiaGosiaJurczakSimoen, EddyEddySimoen2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21068Defect analysis in UTBOX SOI nMOSFETs by low-frequency noiseProceedings paper