Cho, Moon JuMoon JuChoRoussel, PhilippePhilippeRousselKaczer, BenBenKaczerDegraeve, RobinRobinDegraeveFranco, JacopoJacopoFrancoAoulaiche, MarcMarcAoulaicheChiarella, ThomasThomasChiarellaKauerauf, ThomasThomasKaueraufHoriguchi, NaotoNaotoHoriguchiGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130018-9383https://imec-publications.be/handle/20.500.12860/22147Channel hot carrier degradation mechanism in long/short channel n-FinFETsJournal article