Ohyama, H.H.OhyamaTakakura, K.K.TakakuraMatsuoka, H.H.MatsuokaJono, T.T.JonoSimoen, EddyEddySimoenClaeys, CorCorClaeysUemura, J.J.UemuraKishikawa, T.T.Kishikawa2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7944Radiation damage induced in Si photodiodes by High-temerature neutron irradiationJournal article