Panarella, LucaLucaPanarellaKaczer, BenBenKaczerSmets, QuentinQuentinSmetsTyaginov, StanislavStanislavTyaginovSaraza Canflanca, PabloPabloSaraza CanflancaVici, AndreaAndreaViciVerreck, DevinDevinVerreckSchram, TomTomSchramLin, DennisDennisLinKnobloch, TheresiaTheresiaKnoblochGrasser, TiborTiborGrasserLockhart de la Rosa, Cesar JavierCesar JavierLockhart de la RosaKar, Gouri SankarGouri SankarKarAfanasiev, ValeriValeriAfanasiev2024-11-212024-07-312024-11-2120242397-7132WOS:001272305700002https://imec-publications.be/handle/20.500.12860/44239Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETsJournal article10.1038/s41699-024-00482-9WOS:001272305700002RANDOM TELEGRAPH NOISE2-DIMENSIONAL MATERIALSDEVICE