De Clercq, MiguelMiguelDe ClercqMoors, KristofKristofMoorsMagnus, WimWimMagnusSoree, BartBartSoree2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30511Thin film resistivity scaling of metals with conduction band anisotropyMeeting abstract