Defect-related excess low-frequency noise in Ge-on-Si pMOSFETs

Simoen, EddyEddySimoenMitard, JeromeJeromeMitardDe Jaeger, BriceBriceDe JaegerEneman, GeertGeertEnemanDobbie, A.A.DobbieMyronov, M.M.MyronovLeadley, D.R.D.R.LeadleyMeuris, MarcMarcMeurisHoffmann, Thomas Y.Thomas Y.HoffmannClaeys, CorCorClaeys2021-10-192021-10-1920110741-3106https://imec-publications.be/handle/20.500.12860/19792Defect-related excess low-frequency noise in Ge-on-Si pMOSFETsJournal article