Characterization and FE analysis on the shear test of electronic materials

Gonzalez, MarioMarioGonzalezVandevelde, BartBartVandeveldeVan Hoof, RitaRitaVan HoofBeyne, EricEricBeyne2021-10-152021-10-152004-12https://imec-publications.be/handle/20.500.12860/8970Characterization and FE analysis on the shear test of electronic materialsJournal article