Das, JohanJohanDasDegraeve, RobinRobinDegraeveKaczer, BenBenKaczerBoeve, HansHansBoeveVanhelmont, FrederikFrederikVanhelmontGroeseneken, GuidoGuidoGroesenekenBorghs, GustaafGustaafBorghsDe Boeck, JoJoDe Boeck2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7383Degradation and breakdown of plasma oxidized magnetic tunnel junctions: single trap creation in Al2O3 tunnel barriersJournal article