High temperature storage test of GaN-based HEMTs with Ni/TiW/Au gates

Marcon, DenisDenisMarconViaene, JohnJohnViaeneVan Hove, MarleenMarleenVan HoveStoffels, SteveSteveStoffelsDecoutere, StefaanStefaanDecoutere2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21096High temperature storage test of GaN-based HEMTs with Ni/TiW/Au gatesMeeting abstract