BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

Franco, JacopoJacopoFrancoGraziano, SalvatoreSalvatoreGrazianoKaczer, BenBenKaczerCrupi, FeliceFeliceCrupiRagnarsson, Lars-AkeLars-AkeRagnarssonGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-2020120026-2714https://imec-publications.be/handle/20.500.12860/20687BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logicJournal article