Unbiased roughness measurements from low signal-to-noise ratio scanning electron microscope images

Mack, Chris A.Chris A.MackSeveri, JorenJorenSeveriZidan, MohamedMohamedZidanDe Simone, DaniloDaniloDe SimoneLorusso, GianGianLorusso2024-02-272024-01-082024-02-2720231932-5150WOS:001122014300019https://imec-publications.be/handle/20.500.12860/43361Unbiased roughness measurements from low signal-to-noise ratio scanning electron microscope imagesJournal article10.1117/1.JMM.22.2.021006WOS:001122014300019