The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability

Grasser, TiborTiborGrasserReisinger, HansHansReisingerWagner, Paul-JurgenPaul-JurgenWagnerSchanovsky, FranzFranzSchanovskyGoes, WolfgangWolfgangGoesKaczer, BenBenKaczer2021-10-182021-10-182010-05https://imec-publications.be/handle/20.500.12860/17186The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instabilityProceedings paperhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5488859