Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures

Vinicius de Oliveira, AlbertoAlbertoVinicius de OliveiraAgopian, Paula Ghedini DerPaula Ghedini DerAgopianMartino, Joao AntonioJoao AntonioMartinoSimoen, EddyEddySimoenClaeys, CorCorClaeysCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-232021-10-2320160038-1101https://imec-publications.be/handle/20.500.12860/27551Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperaturesJournal articlehttp://www.sciencedirect.com/science/article/pii/S0038110116300351