Simoen, EddyEddySimoenClaeys, CorCorClaeysNeimash, V.V.NeimashKraitchinskii, A.A.KraitchinskiiKras'ko, M.M.Kras'koTischenko, V.V.TischenkoVoitovych, V.V.VoitovychVersluys, J.J.VersluysClauws, P.P.Clauws2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8142High-temperature electron-irradiation induced deep levels in n-type Cz siliconMeeting abstract