The properties, effect and extraction of localized defect profiles from degraded FET characteristics

Vandemaele, MichielMichielVandemaeleKaczer, BenBenKaczerTyaginov, StanislavStanislavTyaginovFranco, JacopoJacopoFrancoDegraeve, RobinRobinDegraeveVaisman Chasin, AdrianAdrianVaisman ChasinWu, ZhichengZhichengWuBury, ErikErikBuryXiang, YangYangXiangMertens, HansHansMertensGroeseneken, GuidoGuidoGroeseneken2022-03-112022-03-1120211541-7026WOS:000672563100075https://imec-publications.be/handle/20.500.12860/39426The properties, effect and extraction of localized defect profiles from degraded FET characteristicsProceedings paper10.1109/IRPS46558.2021.9405164978-1-7281-6893-7WOS:000672563100075DEGRADATIONPERFORMANCECHARGESVOLTAGEMOSFETS