Vincent, BenjaminBenjaminVincentShimura, YosukeYosukeShimuraTakeuchi, ShotaroShotaroTakeuchiNishimura, TsuyoshiTsuyoshiNishimuraDemeulemeester, JelleJelleDemeulemeesterEneman, GeertGeertEnemanClarysse, TrudoTrudoClarysseVandervorst, WilfriedWilfriedVandervorstVantomme, AndreAndreVantommeNakatsuka, OsamuOsamuNakatsukaZaima, ShigeakiShigeakiZaimaDekoster, JohanJohanDekosterCaymax, MattyMattyCaymaxLoo, RogerRogerLoo2021-10-192021-10-192010https://imec-publications.be/handle/20.500.12860/18305Material assessment for uni-axial strained Ge pMOS -1: characterization of GeSn(B) materialsOral presentation