Structural characterization of improved GaN epilayers grown on a Ge(111) substrate

Zhang, YuchengYuchengZhangFu, Wai-YuanWai-YuanFuHumphreys, ColinColinHumphreysLieten, RubenRubenLieten2021-10-192021-10-192011-081882-0778https://imec-publications.be/handle/20.500.12860/20218Structural characterization of improved GaN epilayers grown on a Ge(111) substrateJournal articlehttp://dx.doi.org/10.1143/APEX.4.091001