On the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layers

Simoen, EddyEddySimoenEneman, GeertGeertEnemanShamuilia, SheronSheronShamuiliaSimons, VeerleVeerleSimonsGaubas, E.E.GaubasDelhougne, RomainRomainDelhougneLoo, RogerRogerLooDe Meyer, KristinKristinDe MeyerClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11208On the electrical activity of misfit and threading dislocations in P-N junctions fabricated in thin strain-relaxed buffer layersProceedings paper