Characterization and modeling of transient device behavior under CDM ESD stress

Willemen, J.J.WillemenAndreini, A.A.AndreiniDe Heyn, VincentVincentDe HeynEsmark, K.K.EsmarkEtherton, M.M.EthertonGieser, H.H.GieserGroeseneken, GuidoGuidoGroesenekenMettler, S.S.MettlerMorena, E.E.MorenaQu, S.S.QuSoppa, W.W.SoppaStadler, W.W.StadlerStella, R.R.StellaWilkening, W.W.WilkeningWolf, H.H.WolfZullino, L.L.Zullino2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8401Characterization and modeling of transient device behavior under CDM ESD stressProceedings paper