Perpendicular excitation-probe microwave absorption technique for carrier lifetime analysis in layered structures

Gaubas, EugenijusEugenijusGaubasSimoen, EddyEddySimoenClaeys, CorCorClaeysVanhellemont, JanJanVanhellemont2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4385Perpendicular excitation-probe microwave absorption technique for carrier lifetime analysis in layered structuresJournal article