Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps

Putcha, VamsiVamsiPutchaFranco, JacopoJacopoFrancoVais, AbhitoshAbhitoshVaisSioncke, SonjaSonjaSionckeKaczer, BenBenKaczerLinten, DimitriDimitriLintenGroeseneken, GuidoGuidoGroeseneken2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/31571Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET mapsMeeting abstracthttps://ieeexplore.ieee.org/document/8353603/