Impact of advanced gate stack engineering on low frequency noise performances of planar bulk CMOS transistors

Mercha, AbdelkarimAbdelkarimMerchaOkawa, H.H.OkawaAkheyar, AmalAmalAkheyarSimoen, EddyEddySimoenNakabayashi, T.T.NakabayashiHoffmann, Thomas Y.Thomas Y.Hoffmann2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/15852Impact of advanced gate stack engineering on low frequency noise performances of planar bulk CMOS transistorsProceedings paper