Photoluminescence determination of the Fermi energy in heavily doped strained Si1-xGex layers

Libezny, MilanMilanLibeznyJain, SureshSureshJainPoortmans, JefJefPoortmansCaymax, MattyMattyCaymaxNijs, JohanJohanNijsMertens, RobertRobertMertensWerner, K.K.WernerBalk, P.P.Balk2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/232Photoluminescence determination of the Fermi energy in heavily doped strained Si1-xGex layersJournal article