Direct correlation between low-frequency noise measurements and electromigration lifetimes

Beyne, SofieSofieBeyneCroes, KristofKristofCroesDe Wolf, IngridIngridDe WolfTokei, ZsoltZsoltTokei2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/27849Direct correlation between low-frequency noise measurements and electromigration lifetimesProceedings paperhttp://ieeexplore.ieee.org/document/7936341/