Franco, JacopoJacopoFrancoPutcha, VamsiVamsiPutchaVais, AbhitoshAbhitoshVaisSioncke, SonjaSonjaSionckeWaldron, NiamhNiamhWaldronZhou, DaisyDaisyZhouRzepa, GerhardGerhardRzepaRoussel, PhilippePhilippeRousselGroeseneken, GuidoGuidoGroesenekenHeyns, MarcMarcHeynsCollaert, NadineNadineCollaertLinten, DimitriDimitriLintenGrasser, TiborTiborGrasserKaczer, BenBenKaczer2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28349Characterization of oxide defects in InGaAs MOS gate stacks for high-mobility n-channel MOSFETsProceedings paperhttp://ieeexplore.ieee.org/document/8268347/