Izmailov, R. A.R. A.IzmailovO'Sullivan, BarryBarryO'SullivanPopovici, Mihaela IoanaMihaela IoanaPopoviciAfanas'ev, V. V.V. V.Afanas'ev2021-12-152021-11-022021-12-1520210038-1101WOS:000672563600007https://imec-publications.be/handle/20.500.12860/37793Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layersJournal article10.1016/j.sse.2021.108066WOS:000672563600007