Method to quantify the delocalization of the electronic states in amorphous semiconductors and its application to assessing charge carrier mobility of p-type amorphous oxide semiconductors

de Jamblinne de Meux, AlbertAlbertde Jamblinne de MeuxPourtois, GeoffreyGeoffreyPourtoisGenoe, JanJanGenoeHeremans, PaulPaulHeremans2021-10-252021-10-2520181098-0121https://imec-publications.be/handle/20.500.12860/30526Method to quantify the delocalization of the electronic states in amorphous semiconductors and its application to assessing charge carrier mobility of p-type amorphous oxide semiconductorsJournal articlehttps://link.aps.org/doi/10.1103/PhysRevB.97.045208