Different failure signatures of multiple TLP and HBM stresses in an ESD robust protection structure

Guitard, NicolasNicolasGuitardEssely, FabienFabienEsselyTremouilles, DavidDavidTremouillesBafleur, MariseMariseBafleurNolhier, NicolasNicolasNolhierPerdu, PhilippePhilippePerduTouboul, AndreAndreTouboulPouget, VincentVincentPougetLewis, DeanDeanLewis2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10535Different failure signatures of multiple TLP and HBM stresses in an ESD robust protection structureJournal article