Low-frequency noise study of NMOSFETs with HfO2 gate dielectric

Simoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaPantisano, LuigiLuigiPantisanoClaeys, CorCorClaeys2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9605Low-frequency noise study of NMOSFETs with HfO2 gate dielectricProceedings paper