Accurate de-embedding of the contribution of the test boards to the high-frequency characteristics of backplane connectors

Sercu, StefaanStefaanSercuMartens, LucLucMartens2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2129Accurate de-embedding of the contribution of the test boards to the high-frequency characteristics of backplane connectorsProceedings paper