Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe:C HBT

Piontek, AndreasAndreasPiontekChoi, Li JenLi JenChoiVan Huylenbroeck, StefaanStefaanVan HuylenbroeckVanhoucke, TonyTonyVanhouckeHijzen, ErwinErwinHijzenDecoutere, StefaanStefaanDecoutere2021-10-162021-10-162005-05https://imec-publications.be/handle/20.500.12860/11021Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe:C HBTProceedings paper