Degraeve, RobinRobinDegraeveKerber, AndreasAndreasKerberRoussel, PhilippePhilippeRousselCartier, EdEdCartierKauerauf, ThomasThomasKaueraufPantisano, LuigiLuigiPantisanoGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152003-12https://imec-publications.be/handle/20.500.12860/7480Effect of bulk trap density on HfO2 reliability and yieldProceedings paper