Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunities

Simoen, EddyEddySimoenAoulaiche, MarcMarcAoulaichedos Santos, SaraSarados SantosMartino, JoaoJoaoMartinoStrobel, VincentVincentStrobelCretu, BogdanBogdanCretuRoutoure, J.M.J.M.RoutoureCarin, RegisRegisCarinLuque Rodriguez, AbrahamAbrahamLuque RodriguezJimenez Tejada, Juan AntonioJuan AntonioJimenez TejadaClaeys, CorCorClaeys2021-10-212021-10-2120132162-8769https://imec-publications.be/handle/20.500.12860/23085Low-frequency noise studies on fully depleted UTBOX silicon-on-insulator nMOSFETs: challenges and opportunitiesJournal articlehttp://jss.ecsdl.org/content/2/11/Q205.abstract