Ciofi, IvanIvanCiofiRoussel, PhilippePhilippeRousselWilson, ChrisChrisWilsonCroes, KristofKristofCroes2021-10-282021-10-2820200018-9383https://imec-publications.be/handle/20.500.12860/34908Variability-aware predictive modeling of line-to-line dielectric reliabilityJournal article