Systematic analysis of energy and delay impact of very deep submicron process variability effects in embedded SRAM modules

Wang, HuaHuaWangMiranda, MiguelMiguelMirandaDehaene, WimWimDehaeneCatthoor, FranckyFranckyCatthoorMaex, KarenKarenMaex2021-10-162021-10-162005-03https://imec-publications.be/handle/20.500.12860/11538Systematic analysis of energy and delay impact of very deep submicron process variability effects in embedded SRAM modulesProceedings paper