Beyne, SofieSofieBeyneVarela Pedreira, OlallaOlallaVarela PedreiraDe Wolf, IngridIngridDe WolfTokei, ZsoltZsoltTokeiCroes, KristofKristofCroes2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32539Low-frequency noise measurements to characterize Cu-electromigration down to 44nm metal pitchProceedings paperhttps://ieeexplore.ieee.org/document/8720562