Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous digital circuits

Badaroglu, MustafaMustafaBadarogluVan Heijningen, MarcMarcVan HeijningenGravot, VincentVincentGravotCompiet, JohnJohnCompietDonnay, StephaneStephaneDonnayEngels, MarcMarcEngelsGielen, GeorgesGeorgesGielenDe Man, HugoHugoDe Man2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/5977Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous digital circuitsProceedings paper