Out-of-plane excess carrier density variations in point contact lattice-based test structures for QSSPC contact recombination current measurements

Deckers, JanJanDeckersDebucquoy, MaartenMaartenDebucquoyMertens, RobertRobertMertensPoortmans, JefJefPoortmans2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25169Out-of-plane excess carrier density variations in point contact lattice-based test structures for QSSPC contact recombination current measurementsProceedings paperhttp://www.sciencedirect.com/science/article/pii/S1876610215007754