Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits

Martin-Martinez, J.J.Martin-MartinezAmat, E.E.AmatAyala, N.N.AyalaBargallo Gonzalez, MireiaMireiaBargallo GonzalezVerheyen, PeterPeterVerheyenRodriguez, R.R.RodriguezNafria, M.M.NafriaAymerich, X.X.AymerichSimoen, EddyEddySimoen2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19397Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuitsProceedings paper