Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Fleischmann, ClaudiaClaudiaFleischmannConard, ThierryThierryConardHavelund, R.R.HavelundFranquet, AlexisAlexisFranquetPoleunis, C.C.PoleunisVoroshazi, EszterEszterVoroshaziDelcorte, A.A.DelcorteVandervorst, WilfriedWilfriedVandervorst2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22350Fundamental aspects of Arn+ SIMS profiling of common organic semiconductorsMeeting abstract