Smets, QuentinQuentinSmetsVerhulst, AnneAnneVerhulstKim, Ji-hongJi-hongKimJason, CampbellCampbellJasonNminibapiel, DavidDavidNminibapielVeksler, DmitryDmitryVekslerShrestha, PragyaPragyaShresthaPandey, RahulRahulPandeySimoen, EddyEddySimoenGundlach, DavidDavidGundlachRichter, CurtCurtRichterCheung, Kin. P.Kin. P.CheungDatta, SumanSumanDattaMocuta, AndaAndaMocutaCollaert, NadineNadineCollaertThean, Aaron V-Y.Aaron V-Y.TheanHeyns, MarcMarcHeyns2021-10-242021-10-2420170018-9383https://imec-publications.be/handle/20.500.12860/29463Pulsed I-V on TFETs: modeling and measurementsJournal articlehttps://ieeexplore.ieee.org/document/7873334/