Gaubas, EugenijusEugenijusGaubasTomasiunas, R.R.TomasiunasEneman, GeertGeertEnemanDelhougne, RomainRomainDelhougneSimoen, EddyEddySimoen2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10481Study of recombination and transport characteristics in strain-relaxed Si-SiGe layersJournal article