Dixon-Luinenburg, OberonOberonDixon-LuinenburgCelano, UmbertoUmbertoCelanoVandervorst, WilfriedWilfriedVandervorstParedis, KristofKristofParedis2021-10-272021-10-2720190304-3991https://imec-publications.be/handle/20.500.12860/32907Carrier profiling with Fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InPJournal articlehttps://doi.org/10.1016/j.ultramic.2019.06.009