Profiling of border traps at GeSn and high-K oxide interface

Gupta, SomyaSomyaGuptaSimoen, EddyEddySimoenDobri, AdamAdamDobriVrielinck, HenkHenkVrielinckLauwaert, JohanJohanLauwaertMerckling, ClementClementMercklingGencarelli, FedericaFedericaGencarelliShimura, YosukeYosukeShimuraLoo, RogerRogerLooHeyns, MarcMarcHeyns2021-10-222021-10-222014-10https://imec-publications.be/handle/20.500.12860/23892Profiling of border traps at GeSn and high-K oxide interfaceMeeting abstract