A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K

Martino, Joao AntonioJoao AntonioMartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/756A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77KJournal article