Boeve, HansHansBoeveOepts, W.W.OeptsGirgis, E.E.GirgisSchelten, J.J.ScheltenCoehoorn, R.R.CoehoornDe Boeck, JoJoDe BoeckBorghs, GustaafGustaafBorghs2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3253Reliability of magnetic tunnel-junctionsProceedings paper