HAXPES of GaN film on Si with Cr K alpha photons

Vanleenhove, AnjaAnjaVanleenhoveZborowski, CharlotteCharlotteZborowskiVaesen, IngeIngeVaesenHoflijk, IlseIlseHoflijkConard, ThierryThierryConard2022-01-312021-11-022022-01-3120211055-5269WOS:000687773500002https://imec-publications.be/handle/20.500.12860/37623HAXPES of GaN film on Si with Cr K alpha photonsJournal article10.1116/6.0000888WOS:000687773500002ANGULAR-DISTRIBUTION PARAMETERSANALYTIC FITS