Low-frequency noise sources related to processing-induced extended defects in Si devices

Simoen, EddyEddySimoenVanhellemont, JanJanVanhellemontClaeys, CorCorClaeys2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1495Low-frequency noise sources related to processing-induced extended defects in Si devicesProceedings paper