The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures

Stuer, CindyCindyStuerVan Landuyt, J.J.Van LanduytBender, HugoHugoBenderRooyackers, RitaRitaRooyackersBadenes, GonçalGonçalBadenes2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5689The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structuresJournal article