Celano, UmbertoUmbertoCelanoXiaoli, HuHuXiaoliPandey, KomalKomalPandeyWouters, LennaertLennaertWoutersParedis, KristofKristofParedisHantschel, ThomasThomasHantschelvan der Heide, PaulPaulvan der HeideMartini, AshlieAshlieMartini2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32669Understanding tip-induced nanoscale wear for tomographic atomic force microscopyMeeting abstracthttps://www2.avs.org/symposium2019/Papers/Paper_NS-ThP8.html